Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.

Y. Chang, P. Liao, S. Yeong, Y. Lin, J. Lee, C. Lin, Z. Yu, W. Tsai, and P. McIntyre. IRPS, page 3. IEEE, (2022)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

H J Plüss

H -J Bielig

J. H. Merkin

J H Mazaheri

H J Reeb

Other publications of authors with the same name

Lg = 130 nm GAA MBCFETs with three-level stacked In0.53Ga0.47As nanosheets.H. Jo, I. Lee, J. Baek, S. Lee, S. Choi, H. Kim, H. Jeong, W. Park, J. Yoo, H. Lee and 14 other author(s). VLSI Technology and Circuits, page 397-398. IEEE, (2022)Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/üm and Q = 180 to virtual-source modeling.J. Yoo, H. Jo, I. Lee, S. Choi, J. Baek, S. Lee, H. Jang, M. Kong, H. Kim, H. Lee and 17 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)Search for low-mass dark matter with CsI(Tl) crystal detectorsH. Lee, H. Bhang, J. Choi, S. Choi, I. Hahn, E. Jeon, H. Joo, W. Kang, B. Kim, G. Kim and 21 other author(s). Phys. Rev. D, 90 (5): 052006 (September 2014)Renormalization method for inhomogeneity correction of MR images.D. Chen, L. Li, D. Yoon, J. Lee, and Z. Liang. Medical Imaging: Image Processing, volume 4322 of SPIE Proceedings, SPIE, (2001)Real-time FPGA implementation of Full HD@120Hz frame rate up-conversion system.D. Kim, Y. Cho, J. Lee, H. Byun, and C. Kim. ICCE, page 109-110. IEEE, (2014)Image compression based on MR-CNN (Modified Region Convolutional Neural Network).S. Park, B. Choi, K. Oh, S. Kim, J. Lee, J. Lee, and S. Kang. ISOCC, page 292-293. IEEE, (2017)Object-Oriented Analysis: Criteria and Case Study.J. Drake, W. Tsai, H. Lee, and I. Zualkernan. International Journal of Software Engineering and Knowledge Engineering, 3 (3): 319-350 (1993)The extension of STEP PDM schema for information sharing in a practical application.J. Lee, S. Chae, H. Suh, K. Kwon, Y. Choi, and S. Cho. CE, page 957-965. A. A. Balkema Publishers, (2003)A controlled distributed antenna system for increasing Eb/Io in the DS-CDMA system.J. Lee, J. Roh, J. Kwun, and C. Kang. PIMRC, page 1401-1405. IEEE, (1998)AC TDDB Analysis for HK/IL Gate Stack Breakdown and Frequency-dependent Oxygen Vacancy Trap Generation in Advanced nodes FinFET Devices by SILC Spectrum Methodology.P. Chen, Y. Lee, D. Huang, S. Chen, C. Cheng, J. Lee, and J. He. IRPS, page 11. IEEE, (2022)

BibSonomy

Disambiguation of "Lee, J. H."

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.

Please choose a person to relate this publication to

H J Plüss

H -J Bielig

J. H. Merkin

J H Mazaheri

H J Reeb

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Lee, J. H."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.

Please choose a person to relate this publication to

H J Plüss

H -J Bielig

J. H. Merkin

J H Mazaheri

H J Reeb

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.