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The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.

Y. Chang, P. Liao, S. Yeong, Y. Lin, J. Lee, C. Lin, Z. Yu, W. Tsai, and P. McIntyre. IRPS, page 3. IEEE, (2022)

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Z Taufig

Yu-Ting Yu

Yu-Yu Su

Bence Z Szalai

Milorad Z Djordjevic

Other publications of authors with the same name

The role of the JAK2-STAT3 pathway in pro-inflammatory responses of EMF-stimulated N9 microglial cellsX. Yang, G. He, Y. Hao, C. Chen, M. Li, Y. Wang, G. Zhang, and Z. Yu. J Neuroinflammation, (September 2010)Efficient Path-Space Differentiable Volume Rendering With Respect To Shapes.Z. Yu, C. Zhang, O. Maury, C. Hery, Z. Dong, and S. Zhao. Comput. Graph. Forum, 42 (4): i-x (July 2023)Best paper award winners.Z. Yu, and D. Chen. ITC, page 4. IEEE Computer Society, (2013)New National Science Foundation opportunities for improving undergraduate engineering education.M. Borrego, A. Hilton, L. Everett, S. Finger, D. Millard, and Z. Yu. FIE, page 210-211. IEEE Computer Society, (2013)Workshop: Evaluation of educational research and development projects: Pre-conference workshop.Z. Yu, M. Borrego, L. Everett, S. Finger, and D. Millard. FIE, page 1-2. IEEE Computer Society, (2012)A 1.6Tb/s Chiplet over XSR-MCM Channels using 113Gb/s PAM-4 Transceiver with Dynamic Receiver-Driven Adaptation of TX-FFE and Programmable Roaming Taps in 5nm CMOS.G. Gangasani, D. Hanson, D. Storaska, H. Xu, M. Kelly, M. Shannon, M. Sorna, M. Wielgos, P. Ramakrishna, S. Shi and 5 other author(s). ISSCC, page 122-124. IEEE, (2022)Achieving Privacy-preserving Computation on Data Grids.Z. Yu, and N. Zhang. ISCC, page 763-768. IEEE Computer Society, (2007)4 Bits/cell Hybrid 1F1R for High Density Embedded Non-Volatile Memory and its Application for Compute in Memory.W. Chen, F. Huang, S. Qin, Z. Yu, Q. Lin, P. McIntyre, S. Wong, and H. Wong. VLSI Technology and Circuits, page 244-245. IEEE, (2022)A 112.5Gb/s ADC-DSP-Based PAM-4 Long-Reach Transceiver with >50dB Channel Loss in 5nm FinFET.Z. Guo, A. Mostafa, A. Elshazly, B. Chen, B. Wang, C. Han, C. Wang, D. Zhou, D. Visani, E. Hsiao and 27 other author(s). ISSCC, page 116-118. IEEE, (2022)The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.Y. Chang, P. Liao, S. Yeong, Y. Lin, J. Lee, C. Lin, Z. Yu, W. Tsai, and P. McIntyre. IRPS, page 3. IEEE, (2022)

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Disambiguation of "Yu, Z."

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The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.

Please choose a person to relate this publication to

Z Taufig

Yu-Ting Yu

Yu-Yu Su

Bence Z Szalai

Milorad Z Djordjevic

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Yu, Z."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.

Please choose a person to relate this publication to

Z Taufig

Yu-Ting Yu

Yu-Yu Su

Bence Z Szalai

Milorad Z Djordjevic

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.