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Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding.

, , и . IEEE Trans. Very Large Scale Integr. Syst., 25 (3): 942-953 (2017)

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Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

 

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