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Systematic defect identification through layout snippet clustering., , and . ITC, page 378-387. IEEE Computer Society, (2010)Automatic classification of bridge defects., , and . ITC, page 305-314. IEEE Computer Society, (2010)SLIDER: Simulation of Layout-Injected Defects for Electrical Responses., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (6): 918-929 (2012)Controlling DPPM through Volume Diagnosis., , , , and . VTS, page 134-139. IEEE Computer Society, (2009)Precise failure localization using automated layout analysis of diagnosis candidates., , and . DAC, page 367-372. ACM, (2008)To DFM or not to DFM?, and . DAC, page 65-70. ACM, (2011)Physically-Aware Analysis of Systematic Defects in Integrated Circuits., and . IEEE Des. Test Comput., 29 (5): 81-93 (2012)Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations., , , , and . IEEE Des. Test Comput., 29 (1): 36-47 (2012)Design-for-Manufacturability Assessment for Integrated Circuits Using RADAR., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 33 (10): 1559-1572 (2014)Physically-aware analysis of systematic defects in integrated circuits., and . ITC, page 1-10. IEEE Computer Society, (2011)