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Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations.

R. Blanton, W. Tam, X. Yu, J. Nelson, and O. Poku. IEEE Des. Test Comput., 29 (1): 36-47 (2012)

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Nicole E Nelson

Jeffrey Johnson

Jeffrey Gaynor

Jeffrey Donahue

jeffrey Wimmer

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Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations.R. Blanton, W. Tam, X. Yu, J. Nelson, and O. Poku. IEEE Des. Test Comput., 29 (1): 36-47 (2012)Modeling Shared Resource Contention Using a Hybrid Simulation/Analytical Approach.A. Bobrek, J. Pieper, J. Nelson, J. Paul, and D. Thomas. DATE, page 1144-1149. IEEE Computer Society, (2004)Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.T. Vogels, T. Zanon, R. Desineni, R. Blanton, W. Maly, J. Brown, J. Nelson, Y. Fei, X. Huang, P. Gopalakrishnan and 3 other author(s). ITC, page 508-517. IEEE Computer Society, (2004)Extracting Defect Density and Size Distributions from Product ICs.J. Nelson, T. Zanon, J. Brown, O. Poku, R. Blanton, W. Maly, B. Benware, and C. Schuermyer. IEEE Des. Test Comput., 23 (5): 390-400 (2006)Multiple-detect ATPG based on physical neighborhoods.J. Nelson, J. Brown, R. Desineni, and R. Blanton. DAC, page 1099-1102. ACM, (2006)Power-Performance Simulation and Design Strategies for Single-Chip Heterogeneous Multiprocessors.B. Meyer, J. Pieper, J. Paul, J. Nelson, S. Pieper, and A. Rowe. IEEE Trans. Computers, 54 (6): 684-697 (2005)Automatic classification of bridge defects.J. Nelson, W. Tam, and R. Blanton. ITC, page 305-314. IEEE Computer Society, (2010)Extraction of defect density and size distributions from wafer sort test results.J. Nelson, T. Zanon, R. Desineni, J. Brown, N. Patil, W. Maly, and R. Blanton. DATE, page 913-918. European Design and Automation Association, Leuven, Belgium, (2006)Schedulers as model-based design elements in programmable heterogeneous multiprocessors.J. Paul, A. Bobrek, J. Nelson, J. Pieper, and D. Thomas. DAC, page 408-411. ACM, (2003)Debugging Optimized Code: Concepts and Implementation on DIGITAL Alpha Systems.R. Brender, J. Nelson, and M. Arsenault. Digit. Tech. J., 10 (1): 81-99 (1998)

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Disambiguation of "Nelson, Jeffrey E."

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Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations.

Please choose a person to relate this publication to

Nicole E Nelson

Jeffrey Johnson

Jeffrey Gaynor

Jeffrey Donahue

jeffrey Wimmer

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Nelson, Jeffrey E."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations.

Please choose a person to relate this publication to

Nicole E Nelson

Jeffrey Johnson

Jeffrey Gaynor

Jeffrey Donahue

jeffrey Wimmer

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations.