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Disambiguation of "Aymerich, Xavier"

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The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips.

, , , and . IEEE Trans. Instrumentation and Measurement, 52 (3): 859-864 (2003)

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Xavier Lambin

Xavier Domont

Xavier Fontaine

Arumainathan Xavier

Xavier Leroy

 

Other publications of authors with the same name

The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips., , , and . IEEE Trans. Instrumentation and Measurement, 52 (3): 859-864 (2003)Trapped charge and stress induced leakage current (SILC) in tunnel SiO2 layers of de-processed MOS non-volatile memory devices observed at the nanoscale., , , , , and . Microelectron. Reliab., 49 (9-11): 1188-1191 (2009)FinFET and MOSFET preliminary comparison of gate oxide reliability., , , , , and . Microelectron. Reliab., 46 (9-11): 1608-1611 (2006)A new approach to the modeling of oxide breakdown on CMOS circuits., , , and . Microelectron. Reliab., 44 (9-11): 1519-1522 (2004)Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses., , , , and . Microelectron. Reliab., 49 (9-11): 1024-1028 (2009)Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors., , , , , and . Microelectron. Reliab., 48 (8-9): 1521-1524 (2008)Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope., , , , , and . Microelectron. Reliab., 41 (7): 1041-1044 (2001)Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO2 Gate Oxide on MOS Structures., , and . Microelectron. Reliab., 42 (9-11): 1513-1516 (2002)Pre-breakdown noise in electrically stressed thin SiO2 layers of MOS devices observed with C-AFM., , , and . Microelectron. Reliab., 43 (8): 1203-1209 (2003)Characterising the surface roughness of AFM grown SiO2 on Si., , , , and . Microelectron. Reliab., 41 (7): 1077-1079 (2001)