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Comparative study of test generation methods for simulation accelerators.

W. Kadry, D. Krestyashyn, A. Morgenshtein, A. Nahir, V. Sokhin, J. Park, S. Park, W. Jeong, and J. Son. DATE, page 321-324. ACM, (2015)

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Vitali Gorenoi

Vitali Lazarev

Vitali Selenzow

Vitali Wachtel

Vitali Altholz

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Post-Silicon Validation of the IBM POWER9 Processor.T. Kolan, H. Mendelson, V. Sokhin, K. Reick, E. Tsanko, and G. Wetli. DATE, page 999-1002. IEEE, (2020)Threadmill: a post-silicon exerciser for multi-threaded processors.A. Adir, M. Golubev, S. Landa, A. Nahir, G. Shurek, V. Sokhin, and A. Ziv. DAC, page 860-865. ACM, (2011)Post Silicon Validation of the MMU.T. Kolan, H. Mendelson, V. Sokhin, S. Doron, H. Theiler, S. Aviv, H. Hadad, N. Freidman, E. Tsanko, J. Ludden and 1 other author(s). DATE, page 212-217. IEEE, (2021)Unveiling difficult bugs in address translation caching arrays for effective post-silicon validation.G. Papadimitriou, D. Gizopoulos, A. Chatzidimitriou, T. Kolan, A. Koyfman, R. Morad, and V. Sokhin. ICCD, page 544-551. IEEE Computer Society, (2016)Random Test Generation of Application Programming Interfaces.E. Farchi, K. Prakash, and V. Sokhin. CoRR, (2022)Comparative study of test generation methods for simulation accelerators.W. Kadry, D. Krestyashyn, A. Morgenshtein, A. Nahir, V. Sokhin, J. Park, S. Park, W. Jeong, and J. Son. DATE, page 321-324. ACM, (2015)Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms.W. Kadry, D. Krestyashyn, A. Morgenshtein, A. Nahir, V. Sokhin, J. Park, S. Park, W. Jeong, and J. Son. IEEE Des. Test, 34 (1): 65-76 (2017)Effective post-silicon failure localization using dynamic program slicing.O. Friedler, W. Kadry, A. Morgenshtein, A. Nahir, and V. Sokhin. DATE, page 1-6. European Design and Automation Association, (2014)Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification.D. Lee, T. Kolan, A. Morgenshtein, V. Sokhin, R. Morad, A. Ziv, and V. Bertacco. DAC, page 24:1-24:6. ACM, (2016)Improving Post-silicon Validation Efficiency by Using Pre-generated Data.W. Kadry, A. Koyfman, D. Krestyashyn, S. Landa, A. Nahir, and V. Sokhin. Haifa Verification Conference, volume 8244 of Lecture Notes in Computer Science, page 166-181. Springer, (2013)

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Disambiguation of "Sokhin, Vitali"

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Comparative study of test generation methods for simulation accelerators.

Please choose a person to relate this publication to

Vitali Gorenoi

Vitali Lazarev

Vitali Selenzow

Vitali Wachtel

Vitali Altholz

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Sokhin, Vitali"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Comparative study of test generation methods for simulation accelerators.

Please choose a person to relate this publication to

Vitali Gorenoi

Vitali Lazarev

Vitali Selenzow

Vitali Wachtel

Vitali Altholz

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
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Comparative study of test generation methods for simulation accelerators.