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Disambiguation of "Li, James Chien-Mo"

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A Parallel Test Pattern Generation Algorithm to Meet Multiple Quality Objectives.

, , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 30 (11): 1767-1772 (2011)

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Chen-Chien Li

Chien-Kang Li

Michael James

Audrein James

Chieh Chien

 

Other publications of authors with the same name

Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 24 (11): 1748-1759 (2005)A Multicircuit Simulator Based on Inverse Jacobian Matrix Reuse., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (7): 1130-1137 (2016)An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology., and . J. Electron. Test., 27 (2): 193-201 (2011)Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains., , , , , , , , , and 2 other author(s). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 30 (3): 455-463 (2011)Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 667-674 (2014)Test methodology for PCHB/PCFB Asynchronous Circuits., , , , and . ITC, page 1-8. IEEE, (2018)Diagnosis of single stuck-at faults and multiple timing faults in scan chains.. IEEE Trans. Very Large Scale Integr. Syst., 13 (6): 708-718 (2005)DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 18 (3): 392-400 (2010)Transient IR-Drop Analysis for At-Speed Testing Using Representative Random Walk., , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (9): 1980-1989 (2014)Test Pattern Modification for Average IR-Drop Reduction., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 38-49 (2016)