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Explorations of sequential ATPG using Boolean satisfiability.

, and . VTS, page 85-90. IEEE Computer Society, (1993)

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Mathematical Writing., , and . MAA notes Mathematical Association of America, (1989)Test Pattern Generation for Realistic Bridge Faults in CMOS ICs., and . ITC, page 492-499. IEEE Computer Society, (1991)Generating Test Patterns for Bridge Faults in CMOS ICs., and . EDAC-ETC-EUROASIC, page 165-170. IEEE Computer Society, (1994)Creating small fault dictionaries logic circuit fault diagnosis., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (3): 346-356 (1999)Charge-based fault simulation for CMOS network breaks., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (12): 1555-1567 (1996)Successful Interventions to Eliminate Achievement Gaps in STEM Courses., , , and . RESPECT, page 1-4. IEEE, (2020)Yield Optimization and Its Relation to Test., and . VTS, page 281-282. IEEE Computer Society, (2001)Diagnosing realistic bridging faults with single stuck-at information., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (3): 255-268 (1998)Efficient generation of test patterns using Boolean satisfiability.. Stanford University, USA, (1990)Test pattern generation for current testable faults in static CMOS circuits., and . VTS, page 297-302. IEEE Computer Society, (1991)