Author of the publication

Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS.

, , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 24 (12): 1859-1880 (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Efficient power clock generation for adiabatic logic., and . ISCAS (4), page 642-645. IEEE, (2001)Leakage Current in Deep-Submicron CMOS Circuits., , and . J. Circuits Syst. Comput., 11 (6): 575-600 (2002)A process-tolerant cache architecture for improved yield in nanoscale technologies., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 13 (1): 27-38 (2005)Dual-edge triggered level converting flip-flops., and . ISCAS (2), page 661-664. IEEE, (2004)A novel synthesis approach for active leakage power reduction using dynamic supply gating., , , , and . DAC, page 479-484. ACM, (2005)A Novel Low-Power Scan Design Technique Using Supply Gating., , , , and . ICCD, page 60-65. IEEE Computer Society, (2004)Energy recovery clocked dynamic logic., , , and . ACM Great Lakes Symposium on VLSI, page 468-471. ACM, (2005)Low power synthesis of dynamic logic circuits using fine-grained clock gating., , , and . DATE, page 862-867. European Design and Automation Association, Leuven, Belgium, (2006)Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations., , , and . IEEE Trans. Very Large Scale Integr. Syst., 13 (11): 1286-1295 (2005)Estimation of delay variations due to random-dopant fluctuations in nano-scaled CMOS circuits., , and . CICC, page 17-20. IEEE, (2004)