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Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells.

, , , , and . DFT, page 394-402. IEEE Computer Society, (2008)

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Guaranteed convergence in a class of Hopfield networks., , and . IEEE Trans. Neural Networks, 3 (6): 951-961 (1992)Test Generation for Synchronous Sequential Circuits Using Multiple Observation Times., and . FTCS, page 52-59. IEEE Computer Society, (1991)Synthesis of Multi-Level Combinational Circuits for Complete Robust Path Delay Fault Testability., , , and . FTCS, page 280-287. IEEE Computer Society, (1992)EXOP (Extended Operation): A New Logical Fault Model for Digital Circuits., and . FTCS, page 166-175. IEEE Computer Society, (1993)On the design of robust testable CMOS combinational logic circuits., and . FTCS, page 220-225. IEEE Computer Society, (1988)A supervised machine learning application in volume diagnosis., , , , , , and . ETS, page 1-6. IEEE, (2019)Volume diagnosis data mining., , and . ETS, page 1-10. IEEE, (2017)Input test data volume reduction based on test vector chains., and . European Test Symposium, page 240. IEEE Computer Society, (2010)Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines., , , , and . DATE, page 1022-1027. IEEE, (2019)Selection of a fault model for fault diagnosis based on unique responses., and . DATE, page 994-999. IEEE, (2009)