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Towards approximation during test of Integrated Circuits., , , , , and . DDECS, page 28-33. IEEE, (2017)Synthesis of Finite State Machines on Memristor Crossbars., , , , , and . DDECS, page 107-112. IEEE, (2018)Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection., , , , and . J. Electron. Test., 35 (3): 367-381 (2019)A dynamic programming algorithm for the single-machine scheduling problem with release dates and deteriorating processing times., and . Math. Methods Oper. Res., 69 (2): 271-280 (2009)A Genetic-algorithm-based Approach to the Design of DCT Hardware Accelerators., , , , and . ACM J. Emerg. Technol. Comput. Syst., 18 (3): 50:1-50:25 (2022)Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*., , , , , , , , , and 2 other author(s). ETS, page 1-10. IEEE, (2021)Fast Bridging Fault Diagnosis using Logic Information., , , , , and . ATS, page 33-38. IEEE, (2007)A Logic Cell Design and routing Methodology Specific to VNWFET., , , , , , , and . NEWCAS, page 460-464. IEEE, (2022)Reliability of computing systems: From flip flops to variables., , , , and . IOLTS, page 196-198. IEEE, (2017)