Author of the publication

A 5 GHz sub-harmonic direct down-conversion mixer for dual-band system in 0.35µm SiGe BiCMOS.

, , , , , and . ISCAS (5), page 4807-4810. IEEE, (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A Varying Pulse Width Second Order Derivative Gaussian Pulse Generator for UWB Transceivers in CMOS., , , , , , and . ISCAS, page 2794-2797. IEEE, (2007)Visible Light Communication Cyber-Physical Systems-on- Chip for Smart Cities., , , , , , , and . J. Commun., 14 (12): 1141-1146 (2019)Introduction to the Special Section on the 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.. IEEE J. Solid State Circuits, 49 (9): 1875 (2014)Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS., , , , , , , , , and 1 other author(s). IEEE J. Solid State Circuits, 46 (5): 1100-1110 (2011)Concurrent Design Analysis of High-Linearity SP10T Switch With 8.5 kV ESD Protection., , , , , , , , , and 3 other author(s). IEEE J. Solid State Circuits, 49 (9): 1927-1941 (2014)A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS., , , , , and . IEEE Access, (2020)Integrated stacked-Spiral RF inductor with nanopowder magnetic Core., , , , , , and . J. Circuits Syst. Comput., (2013)ESDInspector: a new layout-level ESD protection circuitry design verification tool using a smart-parametric checking mechanism., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (10): 1421-1428 (2004)An optimized UWB correlator design with the consideration of the impacts from the ESD protection devices., , and . Sci. China Inf. Sci., 56 (6): 1-9 (2013)A design technique overview on broadband RF ESD protection circuit designs., , , , , , , , and . MWSCAS, page 590-593. IEEE, (2012)