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Low-Power Scan Operation in Test Compression Environment.

, , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (11): 1742-1755 (2009)

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Weyman Jerzy

Szynka Jerzy

Jerzy Cieslik

Jerzy Krzeczowski

Jerzy Blaszczyk

 

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