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Improving the Detectability of Resistive Open Faults in Scan Cells.

, , , , and . DFT, page 383-391. IEEE Computer Society, (2009)

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On Synthesizing and Identifying Stuck-Open Testable CMOS Combinational Circuits (extended abstract).. DAC, page 736-739. IEEE Computer Society Press, (1990)On Computing Signal Probability and Detection Probability of Stuck-at Faults., and . IEEE Trans. Computers, 39 (11): 1369-1377 (1990)Algorithms to compute bridging fault coverage of IDDQ test sets., , and . ACM Trans. Design Autom. Electr. Syst., 2 (3): 281-305 (1997)Diagnostic simulation of stuck-at faults in sequential circuits using compact lists., , , , , and . ACM Trans. Design Autom. Electr. Syst., 6 (4): 471-489 (2001)Special session 11C: Hot topic design consideration and silicon evaluation of on-chip monitors.. VTS, page 350. IEEE Computer Society, (2010)Algorithm to extract two-node bridges., and . IEEE Trans. Very Large Scale Integr. Syst., 11 (4): 741-744 (2003)A Hybrid Kernel Extreme Learning Machine and Improved Cat Swarm Optimization for Microarray Medical Data Classification., , and . Int. J. Appl. Evol. Comput., 7 (3): 71-100 (2016)An Evolutionary Functional Link Neural Fuzzy Model for Financial Time Series Forecasting., , , and . Int. J. Appl. Evol. Comput., 2 (3): 39-58 (2011)Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors., , , and . J. Electron. Test., 19 (4): 437-445 (2003)Testing of Prebond Through Silicon Vias., , and . IEEE Des. Test, 37 (4): 27-34 (2020)