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Disambiguation of "Hora, Camelia"

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On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.

, , , and . J. Electron. Test., 19 (4): 369-376 (2003)

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Camelia Vlad

Camélia Constantin

Friedrich Hora

Heinz Höra

Cornelia Hora

 

Other publications of authors with the same name

Gate Leakage Impact on Full Open Defects in Interconnect Lines., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (12): 2209-2220 (2011)Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model., , , , , and . VTS, page 345-350. IEEE Computer Society, (2003)Diagnosis of Local Spot Defects in Analog Circuits., , , , , and . IEEE Trans. Instrumentation and Measurement, 61 (10): 2701-2712 (2012)Diagnosis of full open defects in interconnect lines with fan-out., , , , , and . European Test Symposium, page 233-238. IEEE Computer Society, (2010)Systematic Defects in Deep Sub-Micron Technologies., , , , and . ITC, page 290-299. IEEE Computer Society, (2004)Diagnosis of Full Open Defects in Interconnecting Lines., , , , , , , and . VTS, page 158-166. IEEE Computer Society, (2007)Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages., , , , , , , and . VTS, page 145-150. IEEE Computer Society, (2007)Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 30 (12): 1911-1922 (2011)Defect Oriented Testing for analog/mixed-signal devices., , , , , , and . ITC, page 1-10. IEEE Computer Society, (2011)Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example., , , , , , and . DATE, page 371-376. IEEE, (2011)