Author of the publication

Compact CMOS-Compatible Majority Gate Using Body Biasing in FDSOI Technology.

, , , , , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 13 (1): 86-95 (March 2023)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

HW/SW Codesign for Robust and Efficient Binarized SNNs by Capacitor Minimization., , , , , and . CoRR, (2023)Compact CMOS-Compatible Majority Gate Using Body Biasing in FDSOI Technology., , , , , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 13 (1): 86-95 (March 2023)Tutorial: The Synergy of Hyperdimensional and In-Memory Computing., , and . CODES+ISSS, page 5-6. IEEE, (2023)Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET., , , , , and . IRPS, page 1-5. IEEE, (2020)Joint Modeling of Multi-Domain Ferroelectric and Distributed Channel towards Unveiling the Asymmetric Abrupt DC Current Jump in Ferroelectric FET., , and . ESSDERC, page 336-339. IEEE, (2022)HW/SW Codesign for Approximate In-Memory Computing., , and . ISQED, page 1-6. IEEE, (2022)On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM., , , , , , and . VTS, page 1-6. IEEE, (2021)Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks., , , , and . VTS, page 1-7. IEEE, (2021)Compact and High-Performance TCAM Based on Scaled Double-Gate FeFETs., , , , and . DAC, page 1-6. IEEE, (2023)Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology., , , , , and . ASP-DAC, page 68-73. IEEE, (2020)