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Modeling the Interdependences Between Voltage Fluctuation and BTI Aging., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (7): 1652-1665 (2019)On the Workload Dependence of Self-Heating in FinFET Circuits., , , and . IEEE Trans. Circuits Syst. II Express Briefs, 67-II (10): 1949-1953 (2020)Massively Parallel Circuit Setup in GPU-SPICE., , , and . IEEE Trans. Computers, 72 (8): 2127-2138 (August 2023)Special Session: Machine Learning for Semiconductor Test and Reliability., , , , , , , , , and . VTS, page 1-11. IEEE, (2021)Reliability Challenges with Self-Heating and Aging in FinFET Technology., , , , , , and . IOLTS, page 68-71. IEEE, (2019)Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 31 (9): 1280-1293 (September 2023)NCFET to Rescue Technology Scaling: Opportunities and Challenges., , , , and . ASP-DAC, page 637-644. IEEE, (2020)Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level., , and . IEEE Trans. Circuits Syst. I Regul. Pap., 66-I (7): 2671-2684 (2019)Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K., , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 70 (8): 3089-3102 (2023)Modeling and Evaluating the Gate Length Dependence of BTI., , and . IEEE Trans. Circuits Syst. II Express Briefs, 66-II (9): 1527-1531 (2019)