( en | de | ru )

 

Disambiguation of "De, Vivek"

Author of the publication

copydeleteadd this publication to your clipboard
A Dual-Input, Digital Hybrid Buck-LDO System Featuring Fast Load Transient Response, Zero-Wire Current Handover & Input PDN Resonance Reduction.

, , , , , , , and . VLSI Circuits, page 1-2. IEEE, (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Nagarajavel Vivekananthan

Vivek Venkataramani

Vivek Ramamurthy

Vivek Bose

Vivek Shetty

 

Other publications of authors with the same name

Reducing the data switching activity of serialized datastreams., , , and . ISCAS, IEEE, (2006)Monolithic voltage conversion in low-voltage CMOS technologies., , , and . Microelectron. J., 36 (9): 863-867 (2005)Intrinsic MOSFET parameter fluctuations due to random dopant placement., , and . IEEE Trans. Very Large Scale Integr. Syst., 5 (4): 369-376 (1997)Analysis of buck converters for on-chip integration with a dual supply voltage microprocessor., , , and . IEEE Trans. Very Large Scale Integr. Syst., 11 (3): 514-522 (2003)Energy-Efficient Computing in Nanoscale CMOS.. IEEE Des. Test, 33 (2): 68-75 (2016)On-Die Supply-Resonance Suppression Using Band-Limited Active Damping., , , , , , , , , and 1 other author(s). ISSCC, page 286-603. IEEE, (2007)Variation-tolerant circuits: circuit solutions and techniques., , and . DAC, page 762-763. ACM, (2005)Comparative Analysis of Conventional and Statistical Design Techniques., , , , , and . DAC, page 238-243. IEEE, (2007)Analysis of dual-VT SRAM cells with full-swing single-ended bit line sensing for on-chip cache., , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 10 (2): 91-95 (2002)Wide-Range Many-Core SoC Design in Scaled CMOS: Challenges and Opportunities., , , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 29 (5): 843-856 (2021)