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Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage.

, , , , , , , , , , , и . Microelectron. Reliab., 54 (9-10): 2147-2150 (2014)

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Stephan Meneghini

Thomas Meneghini

Matteo Garavoglia

Matteo Rini

Marco Matteo

 

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