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Innovative practices session 6C: Latest practices in test compression.

, , , and . VTS, page 1. IEEE Computer Society, (2013)

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Enhancing testability by structured partial scan., , and . VTS, page 152-157. IEEE Computer Society, (2012)XLBIST: X-Tolerant Logic BIST., , , and . ITC, page 1-9. IEEE, (2018)An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test., , , , , , and . ITC, page 1-10. IEEE, (2019)Innovative practices session 10C: Delay test., , , and . VTS, page 1. IEEE Computer Society, (2013)Innovative practices session 6C: Latest practices in test compression., , , and . VTS, page 1. IEEE Computer Society, (2013)Determining Redundancy Requirements for Memory Arrays with Critical Area Analysis., , , , , and . MTDT, page 48-53. IEEE Computer Society, (1999)Hybrid selector for high-X scan compression., , , and . ITC, page 1-10. IEEE Computer Society, (2012)Optimizing Memory Tests by Analyzing Defect Coverage., , , and . MTDT, page 20-28. IEEE Computer Society, (2000)Eliminating the Ouija board: automatic thresholds and probabilistic I_DDQ diagnosis., , and . ITC, page 1065-1072. IEEE Computer Society, (1999)Two-level compression through selective reseeding., , , , , and . ITC, page 1-10. IEEE Computer Society, (2013)