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The effectiveness of different test sets for PLAs.

, и . EURO-DAC, стр. 628-632. IEEE Computer Society, (1990)

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Laurence Maxwell

Hugh Maxwell

Maxwell Kusi-Mensah

Peter C Baumann

C -Peter Fagerstroem

 

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The Heisenberg Uncertainty of Test.. ITC, стр. 13. IEEE Computer Society, (2002)Deception by design: fooling ourselves with gate-level models., и . ITC, стр. 921-929. IEEE Computer Society, (2000)The use of IDDQ testing in low stuck-at coverage situations.. VTS, стр. 84-88. IEEE Computer Society, (1995)Best Methods for At-Speed Testing?, , , , и . VTS, стр. 460-461. IEEE Computer Society, (1998)Let's Grade ALL the Faults.. ITC, стр. 595. IEEE Computer Society, (1993)Total Critical Area Based Testing., и . ITC, стр. 1-10. IEEE, (2018)Defect-Oriented Test: Effectiveness in High Volume Manufacturing., , , , , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (3): 584-597 (2021)Current ratios: a self-scaling technique for production IDDQ testing., , , , , , и . ITC, стр. 1148-1156. IEEE Computer Society, (2000)Quality impacts of non-uniform fault coverage.. VTS, стр. 197-200. IEEE Computer Society, (1994)The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%?, , , и . ITC, стр. 358-364. IEEE Computer Society, (1991)