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Disambiguation of "Wang, Sying-Jyan"

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Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis.

, , , , , , , , , , , and . DATE, page 1710-1711. IEEE, (2020)

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Wang Wang

Linfang Wang

Investigation of the functions of 53BP1 in DNA demethylation. Uni Marburg, (2009)

Lei Wang

Qingwei Wang

Hao Wang

 

Other publications of authors with the same name

Delay Test with Embedded Test Pattern Generator., and . J. Inf. Sci. Eng., 29 (3): 545-556 (2013)Low-Power BIST With a Smoother and Scan-Chain Reorder Under Optimal Cluster Size., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (11): 2586-2594 (2006)Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture., , , and . ATS, page 95-100. IEEE, (2007)TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning., , , , , , , and . ITC, page 1-6. IEEE, (2019)De Bruijn graph-based communication modeling for fault tolerance in smart grids., , and . APCCAS, page 623-626. IEEE, (2012)Design and Synthesis of Self-Checking VLSI Circuits and Systems., and . ICCD, page 578-581. IEEE Computer Society, (1991)PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques., , , , , , and . ETS, page 1-6. IEEE, (2020)Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based Bootstrapped Ring Oscillator., , and . Asian Test Symposium, page 91-96. IEEE Computer Society, (2013)Test generation for combinational hardware Trojans., , , and . AsianHOST, page 1-6. IEEE Computer Society, (2016)Fast and accurate statistical static timing analysis., , and . ISCAS, page 2555-2558. IEEE, (2014)