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BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature.

Y. Zhang, Y. Ding, Z. Peng, H. Li, M. Fujita, and J. Jiang. IEEE Trans. Very Large Scale Integr. Syst., 30 (11): 1677-1690 (2022)

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Li Li

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Task Scheduling in Cloud Computing Based on Cross Entropy Method.Y. Ren, L. Zhou, and H. Li. GRMSE (1), volume 698 of Communications in Computer and Information Science, page 196-202. Springer, (2016)Low-cost rapid prototyping of flexible plastic paper based microfluidic devices.Y. Fan, H. Li, Y. Yi, and I. Foulds. NEMS, page 175-178. IEEE, (2013)Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes.Y. Han, X. Li, H. Li, and A. Chandra. IEEE Trans. Instrum. Meas., 55 (2): 389-399 (2006)Data Remapping for Static NUCA in Degradable Chip Multiprocessors.Y. Wang, L. Zhang, Y. Han, H. Li, and X. Li. IEEE Trans. Very Large Scale Integr. Syst., 23 (5): 879-892 (2015)DHSA: efficient doubly homomorphic secure aggregation for cross-silo federated learning.Z. Liu, S. Chen, J. Ye, J. Fan, H. Li, and X. Li. J. Supercomput., 79 (3): 2819-2849 (2023)Reinventing Memory System Design for Many-Accelerator Architecture.Y. Wang, L. Zhang, Y. Han, and H. Li. J. Comput. Sci. Technol., 29 (2): 273-280 (2014)Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects.Y. Zhang, H. Li, Y. Min, and X. Li. IEEE Trans. Very Large Scale Integr. Syst., 19 (10): 1787-1800 (2011)BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature.Y. Zhang, Y. Ding, Z. Peng, H. Li, M. Fujita, and J. Jiang. IEEE Trans. Very Large Scale Integr. Syst., 30 (11): 1677-1690 (2022)SATAM: A SAT Attack Resistant Active Metering Against IC Overbuilding.A. Cui, Z. Weng, H. Zhang, G. Qu, and H. Li. IEEE Trans. Emerg. Top. Comput., 10 (4): 2025-2041 (2022)Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time.Y. Hu, Y. Han, X. Li, H. Li, and X. Wen. IEICE Trans. Inf. Syst., 89-D (10): 2616-2625 (2006)

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Disambiguation of "Li, Huawei"

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BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature.

Please choose a person to relate this publication to

Li Li

Li Li

Li Li

Li Li

Li Li

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Li, Huawei"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature.

Please choose a person to relate this publication to

Li Li

Li Li

Li Li

Li Li

Li Li

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature.