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E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods.

, , и . CAV (2), том 10427 из Lecture Notes in Computer Science, стр. 104-125. Springer, (2017)

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Uwe Mitransky

Thomas Mitra

Mitra Westermann

Mitra Pourmansour

Mitra Nikpay

 

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