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Disambiguation of "Kobayashi, Kazutoshi"

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A Minimal Roll-Back Based Recovery Scheme for Fault Toleration in Pipeline Processors.

, , , , , and . PRDC, page 237-238. IEEE Computer Society, (2010)

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Kazutoshi Miyazawa

Yoshitake Kobayashi

Wakiko Kobayashi

Makoto Kobayashi

Wataru Kobayashi

 

Other publications of authors with the same name

Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement., , , , and . IPSJ Trans. Syst. LSI Des. Methodol., (2020)ST: PERL package for simulation and test environment., and . ISCAS (5), page 89-92. IEEE, (2001)An E-mode p-GaN HEMT monolithically-integrated three-level gate driver operating with a single voltage supply., , , , , and . IEICE Electron. Express, 18 (6): 20210059 (2021)A 13-bit Radiation-Hardened SAR-ADC with Error Correction by Adaptive Topology Transformation., , , , and . IRPS, page 1-8. IEEE, (2023)Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement., , , , and . IOLTS, page 305-309. IEEE, (2019)Total Ionizing Dose Effects by alpha irradiation on circuit performance and SEU tolerance in thin BOX FDSOI process., , and . IOLTS, page 236-238. IEEE, (2019)Impact of Combinational Logic Delay for Single Event Upset on Flip Flops in a 65 nm FDSOI Process., , , , , and . IRPS, page 1-4. IEEE, (2019)Sensitivity to soft errors of NMOS and PMOS transistors evaluated by latches with stacking structures in a 65 nm FDSOI process., , , and . IRPS, page 3-1. IEEE, (2018)Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements., , , , and . ICICDT, page 68-71. IEEE, (2023)A Stage-Level Recovery Scheme in Scalable Pipeline Modules for High Dependability., , and . IWIA, page 21-29. IEEE, (2010)