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An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory.

M. Chang, S. Shen, C. Liu, C. Wu, Y. Lin, Y. King, C. Lin, H. Liao, Y. Chih, and H. Yamauchi. IEEE J. Solid State Circuits, 48 (3): 864-877 (2013)

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Dong-Shin Shin

Liem Khiem Jang

Tae-Seok Jang

Saeed Jangani

Eun-Ju Jang

Other publications of authors with the same name

An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory.M. Chang, S. Shen, C. Liu, C. Wu, Y. Lin, Y. King, C. Lin, H. Liao, Y. Chih, and H. Yamauchi. IEEE J. Solid State Circuits, 48 (3): 864-877 (2013)An Asymmetric-Voltage-Biased Current-Mode Sensing Scheme for Fast-Read Embedded Flash Macros.M. Chang, Y. Lin, Y. Liu, J. Wu, S. Shen, W. Tsai, and Y. Chih. IEEE J. Solid State Circuits, 50 (9): 2188-2198 (2015)An offset-tolerant current-sampling-based sense amplifier for Sub-100nA-cell-current nonvolatile memory.M. Chang, S. Shen, C. Liu, C. Wu, Y. Lin, S. Wu, C. Huang, H. Lai, Y. King, C. Lin and 3 other author(s). ISSCC, page 206-208. IEEE, (2011)A 0.5V 4Mb logic-process compatible embedded resistive RAM (ReRAM) in 65nm CMOS using low-voltage current-mode sensing scheme with 45ns random read time.M. Chang, C. Wu, C. Kuo, S. Shen, K. Lin, S. Yang, Y. King, C. Lin, and Y. Chih. ISSCC, page 434-436. IEEE, (2012)A Process Variation Tolerant Embedded Split-Gate Flash Memory Using Pre-Stable Current Sensing Scheme.M. Chang, and S. Shen. IEEE J. Solid State Circuits, 44 (3): 987-994 (2009)Layer-Aware Program-and-Read Schemes for 3D Stackable Vertical-Gate BE-SONOS NAND Flash Against Cross-Layer Process Variations.C. Hung, M. Chang, Y. Yang, Y. Kuo, T. Lai, S. Shen, J. Hsu, S. Hung, H. Lue, Y. Shih and 6 other author(s). IEEE J. Solid State Circuits, 50 (6): 1491-1501 (2015)A Low-Voltage Bulk-Drain-Driven Read Scheme for Sub-0.5 V 4 Mb 65 nm Logic-Process Compatible Embedded Resistive RAM (ReRAM) Macro.M. Chang, C. Wu, C. Kuo, S. Shen, S. Yang, K. Lin, W. Shen, Y. King, C. Lin, and Y. Chih. IEEE J. Solid State Circuits, 48 (9): 2250-2259 (2013)

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Disambiguation of "Shen, Shin-Jang"

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An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory.

Please choose a person to relate this publication to

Dong-Shin Shin

Liem Khiem Jang

Tae-Seok Jang

Saeed Jangani

Eun-Ju Jang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Shen, Shin-Jang"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory.

Please choose a person to relate this publication to

Dong-Shin Shin

Liem Khiem Jang

Tae-Seok Jang

Saeed Jangani

Eun-Ju Jang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory.