Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Testability Features of R10000 Microprocessor., , , and . Asian Test Symposium, page 108-111. IEEE Computer Society, (1997)Partial Reset: An Alternative DFT Approach., and . VLSI Design, 1 (4): 299-311 (1994)Robust switch-level test generation., and . VTS, page 107-112. IEEE Computer Society, (1992)On Selecting Flip-Flops for Partial Reset., , , and . ITC, page 1008-1012. IEEE Computer Society, (1993)Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST., , , , , and . VTS, page 359-365. IEEE Computer Society, (2005)Understanding Yield Losses in Logic Circuits., , , , , and . IEEE Des. Test Comput., 21 (3): 208-215 (2004)Yield Analysis of Logic Circuits., , , , , and . VTS, page 103-108. IEEE Computer Society, (2004)Combining multiple DFT schemes with test generation., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (6): 685-696 (1999)Accurately Determining Bridging Defects from Layout., , , , , , , , and . DDECS, page 87-90. IEEE Computer Society, (2007)Augmented partial reset., and . ICCAD, page 716-719. IEEE Computer Society / ACM, (1993)