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Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications.

, , , , and . ITC, page 1-6. IEEE, (2020)

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Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (3): 562-575 (2019)Case Study and Advanced Functional Safety Solution for Automotive SoCs., and . ITC, page 1-8. IEEE, (2018)An Efficient External Memory Test Solution: Case Study for HPC Application., , , , , , , and . VTS, page 1-4. IEEE, (2023)Utilizing ECC Analytics to Improve Memory Lifecycle Management., , , and . ITC, page 383-387. IEEE, (2023)Impact of process variations on read failures in SRAMs., , , and . EWDTS, page 1-4. IEEE Computer Society, (2013)An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters., , , , and . EWDTS, page 1-4. IEEE Computer Society, (2013)Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs., , , , and . ITC, page 1-6. IEEE, (2018)Memory FIT Rate Mitigation Technique for Automotive SoCs., , , , , , , and . ITC, page 1-6. IEEE, (2019)On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI., , , , and . ETS, page 1-4. IEEE, (2023)SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor., , , , and . ITC, page 388-392. IEEE, (2023)