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Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

S. Dilhaire, M. Salhi, S. Grauby, and W. Claeys. Microelectron. Reliab., 43 (9-11): 1609-1613 (2003)

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Stéphane Müller

Stéphane Klein

Stéphane Haussler

Stéphane Aubry

Stéphane Audière

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Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.S. Dilhaire, M. Salhi, S. Grauby, and W. Claeys. Microelectron. Reliab., 43 (9-11): 1609-1613 (2003)Time gating imaging through thick silicon substrate: a new step towards backside characterisation.J. Rampnoux, H. Michel, M. Salhi, S. Grauby, W. Claeys, and S. Dilhaire. Microelectron. Reliab., 46 (9-11): 1520-1524 (2006)Strain energy imaging of a power MOS transistor using speckle interferometry.S. Dilhaire, S. Grauby, S. Jorez, and W. Claeys. IEEE Trans. Reliab., 53 (2): 293-296 (2004)Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment.J. Michaud, G. Pedroza, L. Béchou, L. How, O. Gilard, D. Veyrié, F. Laruelle, and S. Grauby. Microelectron. Reliab., 55 (9-10): 1746-1749 (2015)Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.J. Altet, J. González, D. Gómez, X. Perpiñà, W. Claeys, S. Grauby, C. Dufis, M. Vellvehí, D. Mateo, F. Reverter and 2 other author(s). Microelectron. J., 45 (5): 484-490 (2014)Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. Rampnoux, Y. Ezzahri, S. Dilhaire, S. Grauby, and W. Claeys. Microelectron. Reliab., 43 (9-11): 1803-1807 (2003)ElectroStatic Discharge Fault Localization by Laser Probing.S. Grauby, M. Salhi, W. Claeys, D. Trias, and S. Dilhaire. Microelectron. Reliab., 45 (9-11): 1482-1486 (2005)Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy.S. Dilhaire, S. Grauby, W. Claeys, and J. Batsale. Microelectron. J., 35 (10): 811-816 (2004)Joule expansion imaging techniques on microlectronic devices.S. Grauby, L. Lopez, M. Salhi, E. Puyoo, J. Rampnoux, W. Claeys, and S. Dilhaire. Microelectron. J., 40 (9): 1367-1372 (2009)Applications of temperature phase measurements to IC testing.J. Altet, J. Rampnoux, J. Batsale, S. Dilhaire, A. Rubio, W. Claeys, and S. Grauby. Microelectron. Reliab., 44 (1): 95-103 (2004)

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Disambiguation of "Grauby, Stéphane"

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Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

Please choose a person to relate this publication to

Stéphane Müller

Stéphane Klein

Stéphane Haussler

Stéphane Aubry

Stéphane Audière

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Grauby, Stéphane"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

Please choose a person to relate this publication to

Stéphane Müller

Stéphane Klein

Stéphane Haussler

Stéphane Aubry

Stéphane Audière

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.