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Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

S. Dilhaire, M. Salhi, S. Grauby, and W. Claeys. Microelectron. Reliab., 43 (9-11): 1609-1613 (2003)

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Kristl Claeys

Michael Claeys

Wilfrid Oberhummer

Wilfrid Bemm

Wilfrid Döring

Other publications of authors with the same name

Temperature measurements of metal lines under current stress by high-resolution laser probing.V. Quintard, S. Dilhaire, T. Phan, and W. Claeys. IEEE Trans. Instrumentation and Measurement, 48 (1): 69-74 (1999)Strain energy imaging of a power MOS transistor using speckle interferometry.S. Dilhaire, S. Grauby, S. Jorez, and W. Claeys. IEEE Trans. Reliab., 53 (2): 293-296 (2004)Differential Thermal Testing: An Approach to its Feasibility.J. Altet, A. Rubio, W. Claeys, S. Dilhaire, E. Schaub, and H. Tamamoto. J. Electron. Test., 14 (1-2): 57-66 (1999)Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy.S. Dilhaire, S. Grauby, W. Claeys, and J. Batsale. Microelectron. J., 35 (10): 811-816 (2004)Joule expansion imaging techniques on microlectronic devices.S. Grauby, L. Lopez, M. Salhi, E. Puyoo, J. Rampnoux, W. Claeys, and S. Dilhaire. Microelectron. J., 40 (9): 1367-1372 (2009)Applications of temperature phase measurements to IC testing.J. Altet, J. Rampnoux, J. Batsale, S. Dilhaire, A. Rubio, W. Claeys, and S. Grauby. Microelectron. Reliab., 44 (1): 95-103 (2004)Dynamic Surface Temperature Measurements in ICs.J. Altet, W. Claeys, S. Dilhaire, and A. Rubio. Proc. IEEE, 94 (8): 1519-1533 (2006)Thermal Testing: Fault Location Strategies.J. Altet, A. Rubio, E. Schaub, S. Dilhaire, and W. Claeys. VTS, page 189-194. IEEE Computer Society, (2000)Thermal coupling in integrated circuits: application to thermal testing.J. Altet, A. Rubio, E. Schaub, S. Dilhaire, and W. Claeys. IEEE J. Solid State Circuits, 36 (1): 81-91 (2001)Time gating imaging through thick silicon substrate: a new step towards backside characterisation.J. Rampnoux, H. Michel, M. Salhi, S. Grauby, W. Claeys, and S. Dilhaire. Microelectron. Reliab., 46 (9-11): 1520-1524 (2006)

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Disambiguation of "Claeys, Wilfrid"

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Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

Please choose a person to relate this publication to

Kristl Claeys

Michael Claeys

Wilfrid Oberhummer

Wilfrid Bemm

Wilfrid Döring

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Claeys, Wilfrid"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

Please choose a person to relate this publication to

Kristl Claeys

Michael Claeys

Wilfrid Oberhummer

Wilfrid Bemm

Wilfrid Döring

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.