( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Improving post-silicon error detection with topological selection of trace signals.

, , , , и . VLSI-SoC, стр. 1-6. IEEE, (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Binod Kumar Datta

Binod Bhattarai

Binod Raj Giri

Rohini Kumar

Aditya Kumar

 

Другие публикации лиц с тем же именем

Combining Restorability and Error Detection Ability for Effective Trace Signal Selection., , , и . ACM Great Lakes Symposium on VLSI, стр. 191-196. ACM, (2017)A Methodology to Capture Fine-Grained Internal Visibility During Multisession Silicon Debug., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 28 (4): 1002-1015 (2020)SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement., , и . J. Electron. Test., 35 (5): 655-678 (2019)Implementation of MCL for effective ICT., , , и . WMNC, стр. 1-4. IEEE, (2013)Orion: A Technique to Prune State Space Search Directions for Guidance-Based Formal Verification., , , , , и . ATS, стр. 123-128. IEEE, (2019)Analyzing Hardware Security Properties of Processors through Model Checking., , , и . VLSID, стр. 107-112. IEEE, (2020)Performance modelling of heterogeneous ISA multicore architectures., , , , и . EWDTS, стр. 1-4. IEEE Computer Society, (2016)Silicon Debug with Maximally Expanded Internal Observability Using Nearest Neighbor Algorithm., , , , и . ISVLSI, стр. 46-51. IEEE Computer Society, (2018)Voice conversion using linear prediction coefficients and artificial neural network., , , , и . CUBE, стр. 240-245. ACM, (2012)DeepPeep: Exploiting Design Ramifications to Decipher the Architecture of Compact DNNs., , , и . ACM J. Emerg. Technol. Comput. Syst., 17 (1): 5:1-5:25 (2020)