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Design Optimization for Process-Variation-Tolerant 22-nm FinFET-Based 6-T SRAM Cell with Worst-Case Sampling Method.

, и . IEICE Trans. Electron., 99-C (5): 541-543 (2016)

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Dong-Shin Shin

Jeonghun Shin

Kirche als Weltforum: zum Dialogverständnis in kirchlichen Dokumenten seit dem Zweiten Vatikanischen Konzil. Uni München, (2009)

Hyeseon Shin

Koo Cheul Shin

Hyung-Uk Shin

 

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