( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test.

, , , , и . VTS, стр. 1. IEEE Computer Society, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Soma Mojumder

Soma Sengupta

Gumilar Rusliwa Somantri

Takuya Soma

Soma Mojumder

 

Другие публикации лиц с тем же именем

Data jitter measurement using a delta-time-to-voltage converter method., , , и . ITC, стр. 1-7. IEEE Computer Society, (2007)Analog fault models: Back to the future?. ITC, стр. 1. IEEE Computer Society, (2014)Testing clock distribution circuits using an analytic signal method., , , , , и . ITC, стр. 323-331. IEEE Computer Society, (2001)Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter., , , и . CICC, стр. 161-164. IEEE, (2007)Mixed-signal on-chip timing measurements.. Integr., 26 (1-2): 151-165 (1998)An equivalent-time and clocked approach for continuous-time quantization., , , , , , , и . ISCAS, стр. 2529-2532. IEEE, (2011)A BIST Design of Structured Arrays with Fault-Tolerant Layout., и . ITC, стр. 514-521. IEEE Computer Society, (1988)Test set selection for structural faults in analog IC's., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (7): 1026-1039 (1999)Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method., , , , и . IEEE Trans. Circuits Syst. II Express Briefs, 50 (6): 288-298 (2003)Analytical fault modeling and static test generation for analog ICs., и . ICCAD, стр. 44-47. IEEE Computer Society / ACM, (1994)