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Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test.

, , , , and . VTS, page 1. IEEE Computer Society, (2014)

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Advancements in high-speed link modeling and simulation (An invited paper for CICC 2013)., , and . CICC, page 1-8. IEEE, (2013)Theory, model, and applications of non-Gaussian probability density functions for random jitter/noise with non-white power spectral densities., , and . ITC, page 1-8. IEEE Computer Society, (2013)7.2 A 224Gb/s sub pJ/b PAM-4 and PAM-6 DAC-Based Transmitter in 3nm FinFET., , , , , , , , , and 7 other author(s). ISSCC, page 126-128. IEEE, (2024)Next generation backplane and copper cable challenges., , , , and . IEEE Communications Magazine, 51 (12): 130-136 (2013)Jitter And Signaling Test For High-Speed Links.. CICC, page 65-72. IEEE, (2006)Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test., , , , and . VTS, page 1. IEEE Computer Society, (2014)Design of 224Gb/s DSP-Based Transceiver in CMOS Technology: Signal Integrity, Architecture, Circuits, and Packaging., , , , , , , , , and 13 other author(s). CICC, page 1-8. IEEE, (2024)A 1.41pJ/b 224Gb/s PAM-4 SerDes Receiver with 31dB Loss Compensation., , , , , , , , , and 10 other author(s). ISSCC, page 114-116. IEEE, (2022)Electrical and photonic I/O test and debug., and . CICC, page 1-2. IEEE, (2013)On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing., , , , , and . ITC, page 1-7. IEEE Computer Society, (2012)