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Disambiguation of "Jo, Jeongmin"

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Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology.

, , , , , , , , , , and . IRPS, page 1-7. IEEE, (2021)

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Jo Baier

Changyeon Jo

Il Jo

Jó Ueyama

Sungho Jo

 

Other publications of authors with the same name

Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology., , , , , , , , , and 1 other author(s). IRPS, page 1-7. IEEE, (2021)Read It Now, Not Later! Integrating Semantic Recommendation into In-Browser Web Page Scrap Tool., , and . CHI Extended Abstracts, page 243:1-243:9. ACM, (2023)Position Detection Performance Improvement for LSM Control in Super Speed Maglev., , , and . ICIRA (1), volume 8102 of Lecture Notes in Computer Science, page 97-104. Springer, (2013)Reliability of Industrial grade Embedded-STT-MRAM., , , , , , , , , and 21 other author(s). IRPS, page 1-3. IEEE, (2020)Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET., , , , , , , , , and 6 other author(s). IRPS, page 1-5. IEEE, (2020)Aging-Aware Design Verification Methods Under Real Product Operating Conditions., , , , , , and . IRPS, page 1-4. IEEE, (2019)Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM., , , , , , , , , and 4 other author(s). IRPS, page 1-4. IEEE, (2020)A Preliminary Study of Multimodal Feedback Interfaces in Takeover Transition of Semi-Autonomous Vehicles., , , , , , , , and . AutomotiveUI (Adjunct Proceedings), page 108-113. ACM, (2022)