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Current testing: Dead or alive?

, , , , , и . ETS, стр. 1. IEEE Computer Society, (2013)

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R. A. A. Bowler

M A R Meier

Federico B A A R Matousek

Felix A R Müller

R F A Moritz

 

Другие публикации лиц с тем же именем

Guest Editorial - Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)., , и . J. Electron. Test., 29 (2): 125-126 (2013)A monolithic off-chip IDDQ monitor., , и . ED&TC, стр. 629. IEEE Computer Society, (1997)Semiconductor failure modes and mitigation for critical systems embedded tutorial., и . ETS, стр. 1-3. IEEE Computer Society, (2013)On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC., , и . DATE, стр. 538-542. IEEE Computer Society / ACM, (1999)CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits., и . ED&TC, стр. 266-270. IEEE Computer Society, (1997)On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs., , , и . ATS, стр. 1-6. IEEE, (2020)Current testing: Dead or alive?, , , , , и . ETS, стр. 1. IEEE Computer Society, (2013)A Fully Digital Controlled Off-Chip IDDQ Measurement Unit., , , и . DATE, стр. 495-500. IEEE Computer Society, (1998)IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit., , и . DATE, стр. 959-960. IEEE Computer Society, (1998)Dependable Multicore Architectures at Nanoscale: The View From Europe., , , , , , , , , и 4 other автор(ы). IEEE Des. Test, 32 (2): 17-28 (2015)