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Disambiguation of "Singh, Adit D."

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Current testing: Dead or alive?

, , , , , and . ETS, page 1. IEEE Computer Society, (2013)

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Adit Ranadive

Somak Aditya

Dendy Adityawarman

Noviandi Meta Adityawarman

Sohan Singh

 

Other publications of authors with the same name

Exploiting path delay test generation to develop better TDF tests for small delay defects., , , and . ITC, page 1-10. IEEE, (2017)Special session: Hot topics: Statistical test methods., , , , , and . VTS, page 1-2. IEEE Computer Society, (2015)Test application time minimization for RAS using basis optimization of column decoder., , , , and . ISCAS, page 2614-2617. IEEE, (2010)Sizing CMOS Circuits for Increased Transient Error Tolerance., , , and . IOLTS, page 11-16. IEEE Computer Society, (2004)Special session 4B: Elevator talks., , , , , , , , and . VTS, page 1. IEEE Computer Society, (2013)Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study., , and . ITC, page 362-369. IEEE Computer Society, (1997)An efficient channel routing algorithm for defective arrays., and . ICCAD, page 432-435. IEEE Computer Society, (1989)Scan based two-pattern tests: should they target opens instead of TDFs?. LATS, page 1-2. IEEE Computer Society, (2015)Delay Test Scan Flip-Flop: DFT for High Coverage Delay Testing., and . VLSI Design, page 763-768. IEEE Computer Society, (2007)A random access scans architecture to reduce hardware overhead., , and . ITC, page 9. IEEE Computer Society, (2005)