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Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.

C. Martins, J. Semião, J. Vázquez, V. Champac, M. Santos, I. Teixeira, and J. Teixeira. VTS, page 203-208. IEEE Computer Society, (2011)

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Ingeborg Jörges

Heinz Jörgens

Jay Jorgenson

Konrad Jörgens

Helmut Jörgens

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Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion.J. Vázquez, V. Champac, J. Semião, I. Teixeira, M. Santos, and J. Teixeira. J. Electron. Test., 29 (3): 289-299 (2013)DRAM Performance Sensor.J. Semião, L. Santos, and M. Santos. HCI (7), volume 13308 of Lecture Notes in Computer Science, page 510-521. Springer, (2022)From system level to defect-oriented test: a case study.O. Dias, J. Semião, M. Santos, I. Teixeira, and J. Teixeira. ETW, page 136-141. IEEE Computer Society, (1999)A Zeta-CSC Converter Combination for Single-Input and Bipolar Output.S. Litran, E. Durán, M. Ferrera, J. Semião, and R. Barroso. IECON, page 5721-5726. IEEE, (2019)A distributed load scheduling mechanism for micro grids.J. Monteiro, J. Eduardo, P. Cardoso, and J. Semião. SmartGridComm, page 278-283. IEEE, (2014)Time Management for Low-Power Design of Digital Systems.J. Semião, J. Freijedo, J. Rodríguez-Andina, F. Vargas, M. Santos, I. Teixeira, and J. Teixeira. J. Low Power Electron., 4 (3): 410-419 (2008)Lower VDD Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing.J. Freijedo, M. Valdés, L. Costas, M. Moure, J. Rodríguez-Andina, J. Semião, F. Vargas, I. Teixeira, and J. Teixeira. J. Low Power Electron., 7 (2): 185-198 (2011)On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications.R. Oliveira, J. Semião, I. Teixeira, M. Santos, and J. Teixeira. J. Low Power Electron., 7 (4): 562-572 (2011)Signal Integrity Enhancement in Digital Circuits.J. Semião, M. Rodríguez-Irago, J. Rodríguez-Andina, L. Piccoli, F. Vargas, M. Santos, I. Teixeira, and J. Teixeira. IEEE Des. Test Comput., 25 (5): 452-461 (2008)Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment.J. Semião, J. Freijedo, M. Moraes, M. Mallmann, C. Antunes, J. Benfica, F. Vargas, M. Santos, I. Teixeira, J. Rodríguez-Andina and 5 other author(s). LATW, page 1-6. IEEE, (2009)

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Disambiguation of "Semião, Jorge"

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Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.

Please choose a person to relate this publication to

Ingeborg Jörges

Heinz Jörgens

Jay Jorgenson

Konrad Jörgens

Helmut Jörgens

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Semião, Jorge"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.

Please choose a person to relate this publication to

Ingeborg Jörges

Heinz Jörgens

Jay Jorgenson

Konrad Jörgens

Helmut Jörgens

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
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URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.