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On the C-Testability of Generalized Counters., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 6 (5): 713-726 (1987)Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (10): 2006-2019 (2020)Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits., , and . J. Electron. Test., 14 (3): 259-272 (1999)Performance-Optimized Design for Parametric Reliability., , , , and . J. Electron. Test., 24 (1-3): 129-141 (2008)Real-time use-aware adaptive MIMO RF receiver systems for energy efficiency under BER constraints., , , and . DAC, page 56:1-56:7. ACM, (2013)Application of the Reactivity Index to Propose Intra and Intermolecular Reactivity in Catalytic Materials.. International Conference on Computational Science (3), volume 3993 of Lecture Notes in Computer Science, page 77-81. Springer, (2006)Test generation for specification test of analog circuits using efficient test response observation methods., and . Microelectron. J., 36 (9): 820-832 (2005)Time accelerated Monte Carlo simulations of biological networks using the binomial r-leap method., , , and . Bioinform., 21 (9): 2136-2137 (2005)Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic., , and . IEEE Trans. Very Large Scale Integr. Syst., 18 (4): 675-679 (2010)Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums.. IEEE Trans. Very Large Scale Integr. Syst., 1 (2): 138-150 (1993)