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Identifying systematic spatial failure patterns through wafer clustering.

M. Alawieh, F. Wang, and X. Li. ISCAS, page 910-913. IEEE, (2016)

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Hussein Alawieh

Agnes Bäker

Leila Baker

Rolf Bäker

Alfons Bäker

Other publications of authors with the same name

Algorithm and hardware implementation for visual perception system in autonomous vehicle: A survey.W. Shi, M. Alawieh, X. Li, and H. Yu. Integr., (2017)S2-PM: semi-supervised learning for efficient performance modeling of analog and mixed signal circuits.M. Alawieh, X. Tang, and D. Pan. ASP-DAC, page 268-273. ACM, (2019)Environment-Adaptable Fast Multi-Resolution (EAF-MR) optimization in large-scale RF-FPGA systems.M. Jun, R. Negi, S. Yin, M. Alawieh, F. Wang, M. Sunny, T. Mukherjee, and X. Li. EURASIP J. Wirel. Commun. Netw., (2018)LithoGAN: End-to-End Lithography Modeling with Generative Adversarial Networks.W. Ye, M. Alawieh, Y. Lin, and D. Pan. DAC, page 107. ACM, (2019)Efficient programming of reconfigurable radio frequency (RF) systems.M. Alawieh, F. Wang, J. Tao, S. Yin, M. Jun, X. Li, T. Mukherjee, and R. Negi. ICCAD, page 772-779. IEEE, (2017)Efficient analog circuit optimization using sparse regression and error margining.M. Alawieh, F. Wang, R. Kanj, X. Li, and R. Joshi. ISQED, page 410-415. IEEE, (2016)Identifying systematic spatial failure patterns through wafer clustering.M. Alawieh, F. Wang, and X. Li. ISCAS, page 910-913. IEEE, (2016)Powernet: SOI Lateral Power Device Breakdown Prediction With Deep Neural Networks.J. Chen, M. Alawieh, Y. Lin, M. Zhang, J. Zhang, Y. Guo, and D. Pan. IEEE Access, (2020)Efficient Hierarchical Performance Modeling for Analog and Mixed-Signal Circuits via Bayesian Co-Learning.M. Alawieh, F. Wang, and X. Li. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (12): 2986-2998 (2018)DREAMPlaceFPGA: An Open-Source Analytical Placer for Large Scale Heterogeneous FPGAs using Deep-Learning Toolkit.R. Rajarathnam, M. Alawieh, Z. Jiang, M. Iyer, and D. Pan. ASP-DAC, page 300-306. IEEE, (2022)

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Disambiguation of "Alawieh, Mohamed Baker"

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Identifying systematic spatial failure patterns through wafer clustering.

Please choose a person to relate this publication to

Hussein Alawieh

Agnes Bäker

Leila Baker

Rolf Bäker

Alfons Bäker

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Alawieh, Mohamed Baker"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Identifying systematic spatial failure patterns through wafer clustering.

Please choose a person to relate this publication to

Hussein Alawieh

Agnes Bäker

Leila Baker

Rolf Bäker

Alfons Bäker

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Identifying systematic spatial failure patterns through wafer clustering.