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Study for the non-contact characterization of metallization ageing of power electronic semiconductor devices using the eddy current technique.

, , , , и . Microelectron. Reliab., 51 (6): 1127-1135 (2011)

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Pierre-Yves Vandenbussche

Pierre-Yves Chevalier

Pierre-Yves Laffont

Pierre-Yves Lucas

Yves Pierre Clocuh

 

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