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HCI Temperature sense effect from 180nm to 28nm nodes., , , , and . IRPS, page 1-5. IEEE, (2021)Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement., , , and . IRPS, page 1-6. IEEE, (2019)Comparison of variability of HCI induced drift for SiON and HKMG devices., , , and . IRPS, page 1-5. IEEE, (2020)A new method for quickly evaluating reversible and permanent components of the BTI degradation., , , , , , , and . IRPS, page 6-1. IEEE, (2018)Insight Into HCI Reliability on I/O Nitrided Devices., , , , , , , , , and 2 other author(s). IRPS, page 1-5. IEEE, (2023)AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment., , , , , and . IRPS, page 4. IEEE, (2018)Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment., , , , , , , and . IRPS, page 5. IEEE, (2015)Process Optimization for HCI Improvement in I/O Analog Devices., , , , , , , and . IRPS, page 1-6. IEEE, (2019)Lighting controls and energy savings potential in tropical zone., , , and . EAI Endorsed Trans. Collab. Comput., 3 (11): e4 (2017)