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Identification of unsettable flip-flops for partial scan and faster ATPG., , и . ICCAD, стр. 63-66. IEEE Computer Society / ACM, (1996)Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists., , , , , и . DAC, стр. 133-138. ACM Press, (1995)Dynamic diagnosis of sequential circuits based on stuck-at faults., , и . VTS, стр. 198-203. IEEE Computer Society, (1996)Cell-Aware ATPG to Improve Defect Coverage for FPGA IPs and Next Generation Zynq® MPSoCs., , , , и . ATS, стр. 157-162. IEEE Computer Society, (2017)Fault Diagnosis Using State Information., , и . FTCS, стр. 96-103. IEEE Computer Society, (1996)Characterization and Implicit Identification of Sequential Indistinguishability., , и . VLSI Design, стр. 376-380. IEEE Computer Society, (1997)Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis., , и . ITC, стр. 250-259. IEEE Computer Society, (2002)Comparing functional and structural tests., , и . ITC, стр. 400-407. IEEE Computer Society, (2000)Using FPGA configuration memory to accelerate yield learning for advanced process., , и . ATS, стр. 511-516. IEEE, (2007)Diagnostic Test Pattern Generation for Sequential Circuits., , , и . VTS, стр. 196-202. IEEE Computer Society, (1997)