Author of the publication

Delay Defect Characteristics and Testing Strategies.

, , and . IEEE Des. Test Comput., 20 (5): 8-16 (2003)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Automated diagnosis of VLSI failures., , and . VTS, page 187-192. IEEE Computer Society, (1991)Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players?, , , , , , and . VTS, page 1-2. IEEE Computer Society, (2014)Fault dictionary compression and equivalence class computation for sequential circuits., , and . ICCAD, page 508-511. IEEE Computer Society / ACM, (1993)Metaheuristic Optimization of Insulin Infusion Protocols Using Historical Data with Validation Using a Patient Simulator., , , and . Vietnam. J. Comput. Sci., 8 (2): 263-290 (2021)Metaheuristics for Discovering Favourable Continuous Intravenous Insulin Rate Protocols from Historical Patient Data., , , and . ACIIDS (1), volume 12033 of Lecture Notes in Computer Science, page 157-169. Springer, (2020)Logical Diagnosis Solutions Must Drive Yield Improvement.. ITC, page 434. IEEE Computer Society, (1997)Two-Stage Fault Location., , and . ITC, page 963-968. IEEE Computer Society, (1991)Dynamic fault dictionaries and two-stage fault isolation., and . IEEE Trans. Very Large Scale Integr. Syst., 6 (1): 176-180 (1998)Delay Defect Characteristics and Testing Strategies., , and . IEEE Des. Test Comput., 20 (5): 8-16 (2003)Process defect trends and strategic test gaps., , , , and . ITC, page 1-8. IEEE Computer Society, (2014)