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Delay Defect Characteristics and Testing Strategies.

, , и . IEEE Des. Test Comput., 20 (5): 8-16 (2003)

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Другие публикации лиц с тем же именем

Automated diagnosis of VLSI failures., , и . VTS, стр. 187-192. IEEE Computer Society, (1991)Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players?, , , , , , и . VTS, стр. 1-2. IEEE Computer Society, (2014)Fault dictionary compression and equivalence class computation for sequential circuits., , и . ICCAD, стр. 508-511. IEEE Computer Society / ACM, (1993)Two-Stage Fault Location., , и . ITC, стр. 963-968. IEEE Computer Society, (1991)Metaheuristic Optimization of Insulin Infusion Protocols Using Historical Data with Validation Using a Patient Simulator., , , и . Vietnam. J. Comput. Sci., 8 (2): 263-290 (2021)Metaheuristics for Discovering Favourable Continuous Intravenous Insulin Rate Protocols from Historical Patient Data., , , и . ACIIDS (1), том 12033 из Lecture Notes in Computer Science, стр. 157-169. Springer, (2020)Logical Diagnosis Solutions Must Drive Yield Improvement.. ITC, стр. 434. IEEE Computer Society, (1997)Dynamic fault dictionaries and two-stage fault isolation., и . IEEE Trans. Very Large Scale Integr. Syst., 6 (1): 176-180 (1998)Delay Defect Characteristics and Testing Strategies., , и . IEEE Des. Test Comput., 20 (5): 8-16 (2003)Process defect trends and strategic test gaps., , , , и . ITC, стр. 1-8. IEEE Computer Society, (2014)