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Disambiguation of "Li, Katherine Shu-Min"

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Integrated Scratch Marker for Wafer Defect Diagnosis.

, , , , , and . ITC-Asia, page 1-4. IEEE, (2021)

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Shu Li

Li Shu

Min Li

Min-Shu Chao

Shu-Ming Li

 

Other publications of authors with the same name

Fault tolerant application-specific NoC topology synthesis for three-dimensional integrated circuits., , , , , and . SoCC, page 296-301. IEEE, (2011)IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection., , , and . J. Electron. Test., 23 (4): 341-355 (2007)Multiple Scan Trees Synthesis for Test Time/Data and Routing Length Reduction Under Output Constraint.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (4): 618-626 (2010)IEEE 1500 Compatible Multilevel Maximal Concurrent Interconnect Test., and . IEEE Trans. Very Large Scale Integr. Syst., 21 (7): 1333-1337 (2013)Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture., , , and . ATS, page 95-100. IEEE, (2007)TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning., , , , , , , and . ITC, page 1-6. IEEE, (2019)Oscillation ring based interconnect test scheme for SOC., , , and . ASP-DAC, page 184-187. ACM Press, (2005)IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults., , , , and . ASP-DAC, page 366-371. IEEE, (2006)De Bruijn graph-based communication modeling for fault tolerance in smart grids., , and . APCCAS, page 623-626. IEEE, (2012)Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based Bootstrapped Ring Oscillator., , and . Asian Test Symposium, page 91-96. IEEE Computer Society, (2013)