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System chip test: how will it impact your design?, и . DAC, стр. 136-141. ACM, (2000)Minimal March Tests for Detection of Dynamic Faults in Random Access Memories., , и . J. Electron. Test., 23 (1): 55-74 (2007)Effective march algorithms for testing single-order addressed memories., и . J. Electron. Test., 5 (4): 337-345 (1994)Count-based BIST compaction schemes and aliasing probability computation., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 11 (6): 768-777 (1992)Challenges in testing core-based system ICs., и . IEEE Commun. Mag., 37 (6): 104-109 (1999)International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia., , , , и . ITC, стр. 1-4. IEEE, (2019)Guest Editors' Introduction: Design & Test of a High-Volume 3-D Stacked Graphics Processor With High-Bandwidth Memory., и . IEEE Des. Test, 34 (1): 6-7 (2017)Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs., , , , и . ITC, стр. 1-6. IEEE, (2018)Memory FIT Rate Mitigation Technique for Automotive SoCs., , , , , , , и . ITC, стр. 1-6. IEEE, (2019)Guest Editors' Introduction: East Meets West., и . IEEE Des. Test Comput., 13 (1): 5-7 (1996)