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Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set.

I. Pomeranz. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (4): 1336-1345 (April 2023)

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Irith Baumann

Irith Wiegand

Irith Bittmann

Alexander Pomeranz

Irith Bittmann

Other publications of authors with the same name

Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits.I. Pomeranz, and S. Reddy. IEEE Trans. Computers, 49 (6): 596-607 (2000)On the Switching Activity and Static Test Compaction of Multicycle Scan-Based Tests.I. Pomeranz. IEEE Trans. Computers, 61 (8): 1179-1188 (2012)Location of Stuck-At Faults and Bridging Faults Based on Circuit Partitioning.I. Pomeranz, and S. Reddy. IEEE Trans. Computers, 47 (10): 1124-1135 (1998)On the Role of Hardware Reset in Synchronous Sequential Circuit Test Generation.I. Pomeranz, and S. Reddy. IEEE Trans. Computers, 43 (9): 1100-1105 (1994)On the Computation of Common Test Data for Broadside and Skewed-Load Tests.I. Pomeranz. IEEE Trans. Computers, 61 (4): 578-583 (2012)On the Number of Tests to Detect All Path Delay Faults in Combinational Logic Circuits.I. Pomeranz, and S. Reddy. IEEE Trans. Computers, 45 (1): 50-62 (1996)Signal-Transition Patterns of Functional Broadside Tests.I. Pomeranz. IEEE Trans. Computers, 62 (12): 2544-2549 (2013)Static test compaction for delay fault test sets consisting of broadside and skewed-load tests.I. Pomeranz. VTS, page 84-89. IEEE Computer Society, (2011)On clustering of undetectable transition faults in standard-scan circuits.I. Pomeranz. VTS, page 128-133. IEEE Computer Society, (2011)Switching Activity as a Test Compaction Heuristic for Transition Faults.I. Pomeranz, and S. Reddy. IEEE Trans. Very Large Scale Integr. Syst., 18 (9): 1357-1361 (2010)

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Disambiguation of "Pomeranz, Irith"

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Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set.

Please choose a person to relate this publication to

Irith Baumann

Irith Wiegand

Irith Bittmann

Alexander Pomeranz

Irith Bittmann

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Pomeranz, Irith"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set.

Please choose a person to relate this publication to

Irith Baumann

Irith Wiegand

Irith Bittmann

Alexander Pomeranz

Irith Bittmann

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set.