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Parameter identification for behavioral modeling of analog components including degradation.

, , , , and . MIXDES, page 336-340. IEEE, (2016)

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Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process., , , , and . MIXDES, page 353-358. IEEE, (2016)Behavioral modeling of a sensor interface circuit including various non-idealities., , , , and . SMACD, page 1-4. IEEE, (2017)Parameter identification for behavioral modeling of analog components including degradation., , , , and . MIXDES, page 336-340. IEEE, (2016)Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits., , , , , and . MIXDES, page 363-368. IEEE, (2016)Online monitoring of NBTI and HCD in beta-multiplier circuits., , , , and . IOLTS, page 209-210. IEEE, (2016)Design for reliability of generic sensor interface circuits., , , , , and . Microelectron. Reliab., (2018)Analysis of aging effects - From transistor to system level., , , , and . Microelectron. Reliab., (2016)Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability., , , and . SMACD, page 65-68. IEEE, (2018)On-line monitoring and error correction in sensor interface circuits using digital calibration techniques., , , , and . VTS, page 1-6. IEEE Computer Society, (2018)Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process., , , , and . IOLTS, page 121-125. IEEE, (2016)